Abstract

• Strontium stannate titanate, Sr(SnxTi1-x)O3 thin films on silicon substrates were successfully prepared by spin coating technique. The crystallographic properties of the films were analyzed by X-ray diffractometer and a cubic perovskite structure was found in all samples. The surface morphologies of the films were investigated using scanning electron microscope (SEM) and it was observed that fine grains with different sizes distributed the whole surface of the films. The dielectric constants as a function of applied electric field were calculated from capacitance-voltage measurements at the frequency range of 1 kHz to 100 kHz using LCR meter and the transition behavior was studied depend upon tin content.